This manual may contain references to HP or Hewlett-Packard. Please note that Hewlett-. Packard’s former test and measurement, semiconductor products and. A. • Test frequencies – 10 kHz to 10 MHz. • Test signal level – 1 mV to 1 V rms. • % basic AUTO MANUAL DOWN UP. SELF. TEST The A operates over a frequency range of Hz to kHz ually or under HP-IB control. The HP A and HP A Multi-frequency LCR Meters, microprocessor- based impedance . Trigger: internal, external or manual. Measurement terminals.

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Deviation spread in counts is Weight: Fasten it to the rear panel with the two screws Here is how to cancel out the effect of residuals with the offset adjustment: For storing the desired control settings in the memory, proceed as follows: Rack Flange and Front Handle Kit.

Index of /~kurt/manuals/manuals/HP Agilent

Effect of Resonance In sample example. Note Options other than those illustrated are not displayed. Note If 4275s terminal is grounded, a signal current of equal magnitude an operating condition of the four terminal measurement configu- ration will not flow in the in- ner and outer conductors of the measurement cable.

For semiconductor measurements, the special care needed for making reli- able measurement is described in Figure This wide range voltage con- trol capability is suitable for dc bias applications in general capacitance measure- ments.

Principle of the four terminal configuration measurement is illus- trated in Figure The contents of the shipment should be as shown in Figure This lamp lights and indicates that a dc. Line Voltage and Fuse Selection.


Index of /~kurt/manuals/manuals/HP Agilent

Bias voltage control range: Thus, these accuracy graphs show different Curves for lower and higher measurement values. Meas- ured sample values include factors which vary such values because of electromagnetic effects such as the well-known skin effect of a conductor, the general characteristics of ferromagnetic inductor cores, and effects of dielectric materials in capacitors.

If the instrument 1s faulty, a test step number is displayed at the point where the failure is detected.

Sample Program 1 with the A The effective resist- ance increases at resonance even if the in- ductor has ideally mankal resistance at dc. Use strong shipping container.

A LCR METER [Obsolete] | Keysight (formerly Agilent’s Electronic Measurement)

Option AnnunciationOption Manjal tance value of sample should be O. For use, the instru- ment stands are designed to be pulled towards the front of instrument. Typical measurement applications for semiconductor P-N and MOS junction capacitances are summarized in the tabulation below. Front Panel Features Sheet 2 of 4.

Specifications sheet 2 of 8. Ro is lead resistance. Auto Series and Parallel. As the characteristic impedance of the test calbe is also a factor in the pro- pagation loss and phase shift and of result- ant measuremet errorusing different type test cables must be avoided.

Memorized control settings are restored by turning the instrument on or by pressing front panel keys. Residuals Present in Measuring Circuit The test frequency display is switched, in turn. Wrap instrument in heavy paper or plastic. To break the data into two groups limits line length for outputting to certain pe- ripherals such as to an HP Model A Ther- mal Printer, the delimiter form bit on A22 board is set to 1 see paragraph If the bias voltage across sample is not given sufficient time to settle, the displayed value may fluctuate or Err4 may be displayed.


Set A controls according to Gen- eral Component Measurement procedure Figure steps 7 through What are the major reasons for these changes in sample values? Search the history of over billion web pages on the Internet. If a forward current flows through P-N junction when test signal is at its peak voltage, a correct measurement result will not be obtained.

Since the effect of test cables on measurements and the resultant measurement error increase in proportion to test frequency, cable length must be taken into consideration in high frequency measure- ments. Fig- ure graphically shows the relationships of parallel and series parameters for various dissipation factor values.

When a display, in itself, fails the test will, nevertheless, go through its entire sequence. The measured values most useful to actual applications can be gained by such measurements taken under normal operating conditions of the sample.

Equivalent Series Resist- ance or Conductance together with inductance or capacitance measurement. Figure provides instructions for line voltage and fuse selection.

Use 2475a a microprocessor also facilitates the high reliability design of the A. The bias voltage is set in three digits in three decade ranges as follows: Sample Program 2 with the A This paragraph outlines the proper method and procedures for establishing such bias current through an inductive resistive sample from an external dc bias supply.

Instrument power line fuse is Installed in this holder: